Stochastic Diffusion Modeling of Degradation Data

Accelerated degradation tests (ADTs) can provide timely relia bility information of product. Hence ADTs have been widely used to assess the lifetime distribution highly reliable products. In order properly predict distribution, modeling product’s path plays a key role in analysis. this paper, we use stochastic diffusion process describe and recursive formula for be obtained by using first passage time (FPT) its path. addition, two approxi mate formulas mean-time-to-failure (MTTF) median life (B50) are given. Finally, extend proposed method case ADT real LED data is illustrate procedure. The results demonstrate that has good performance prediction.